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ORCIDFranco Stellari
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2020 – today
- 2022
[c22]Franco Stellari, Ernest Y. Wu, Martin M. Frank, Leonidas E. Ocala, Takashi Ando, Peilin Song:
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation. ESSDERC 2022: 293-296- [c21]Franco Stellari, Peilin Song:
Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security. ITC 2022: 28-35 - 2020
- [i1]Benjamin Tan
, Ramesh Karri, Nimisha Limaye, Abhrajit Sengupta, Ozgur Sinanoglu, Md. Moshiur Rahman, Swarup Bhunia, Danielle Duvalsaint, Ronald D. Blanton, Amin Rezaei, Yuanqi Shen, Hai Zhou, Leon Li, Alex Orailoglu, Zhaokun Han, Austin Benedetti, Luciano Brignone, Muhammad Yasin, Jeyavijayan Rajendran, Michael Zuzak, Ankur Srivastava, Ujjwal Guin, Chandan Karfa, Kanad Basu, Vivek V. Menon, Matthew French, Peilin Song, Franco Stellari, Gi-Joon Nam, Peter Gadfort, Alric Althoff, Joseph Tostenrude, Saverio Fazzari, Eric Breckenfeld, Kenneth Plaks:
Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking. CoRR abs/2006.06806 (2020)
2010 – 2019
- 2019
- [c20]Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert:
Case Study of Advanced Diagnostic Techniques for Multi Port Register File. NATW 2019: 1-9 - [c19]Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song:
Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS 2019: 1 - 2018
- [c18]Franco Stellari, Naigang Wang, Peilin Song:
Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress. ESSDERC 2018: 250-253 - [c17]Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song:
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS 2018: 6 - 2016
- [c16]Franco Stellari, Peilin Song, Manuel Villalobos, John Sylvestri:
Revealing SRAM memory content using spontaneous photon emission. VTS 2016: 1-6 - 2015
- [c15]Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay:
Time-integrated photon emission as a function of temperature in 32 nm CMOS. IRPS 2015: 2 - [c14]Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song:
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS 2015: 2 - 2014
- [c13]Franco Stellari, Peilin Song, Alan J. Weger, Jim Culp, A. Herbert, Dirk Pfeiffer:
Verification of untrusted chips using trusted layout and emission measurements. HOST 2014: 19-24 - [c12]Peilin Song, Franco Stellari, Alan J. Weger:
Counterfeit IC detection using light emission. ITC 2014: 1-8 - [c11]Franco Stellari, Peilin Song, Herschel A. Ainspan:
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements. VTS 2014: 1-6 - 2012
- [c10]Franco Stellari, Thomas Cowell, Peilin Song, Michael Sorna, Zeynep Toprak Deniz, John F. Bulzacchelli, Nandita A. Mitra:
Root cause identification of an hard-to-find on-chip power supply coupling fail. ITC 2012: 1-7 - [c9]Peilin Song, Franco Stellari:
Tester-based optical and electrical diagnostic system and techniques. VTS 2012: 209-214 - 2011
- [c8]Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt:
MARVEL - Malicious alteration recognition and verification by emission of light. HOST 2011: 117-121 - 2010
- [j11]Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy:
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(8): 1838-1847 (2010)
2000 – 2009
- 2009
- [c7]Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza:
On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). ITC 2009: 1-10 - 2008
- [c6]Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy:
A high sensitivity process variation sensor utilizing sub-threshold operation. CICC 2008: 125-128 - [c5]Peilin Song, Stephen Ippolito, Franco Stellari, John Sylvestri, Tim Diemoz, George Smith, Paul Muench, Norm James, Seongwon Kim, Hector Saenz:
Optical Diagnostics for IBM POWER6- Microprocessor. ITC 2008: 1-9 - 2006
- [c4]Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steven C. Wilson, John Pennings, Richard F. Rizzolo:
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. ITC 2006: 1-10 - 2005
- [j10]Alberto Tosi, Franco Stellari, Franco Zappa:
Innovative packaging technique for backside optical testing of wire-bonded chips. Microelectron. Reliab. 45(9-11): 1493-1498 (2005) - [j9]Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steven C. Wilson, Philip Wu, Alberto Tosi:
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). Microelectron. Reliab. 45(9-11): 1550-1553 (2005) - [c3]Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus:
An advanced optical diagnostic technique of IBM z990 eServer microprocessor. ITC 2005: 9 - 2004
- [j8]Alberto Tosi, Franco Stellari, Franco Zappa:
Current crowding in faulty MOSFET: optical and electrical investigation. Microelectron. Reliab. 44(9-11): 1577-1581 (2004) - [j7]Franco Stellari, Peilin Song:
Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD). Microelectron. Reliab. 44(9-11): 1663-1668 (2004) - [j6]Franco Stellari, Alberto Tosi, Franco Zappa, Sergio Cova:
CMOS circuit testing via time-resolved luminescence measurements and simulations. IEEE Trans. Instrum. Meas. 53(1): 163-169 (2004) - [c2]Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia:
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. ITC 2004: 140-147 - 2003
- [j5]Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steven C. Wilson:
Latchup Analysis Using Emission Microscopy. Microelectron. Reliab. 43(9-11): 1603-1608 (2003) - [j4]Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43(9-11): 1663-1668 (2003) - [j3]Alberto Tosi, Franco Stellari, Franco Zappa, Sergio Cova:
Backside Flip-Chip testing by means of high-bandwidth luminescence detection. Microelectron. Reliab. 43(9-11): 1669-1674 (2003) - [c1]Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245 - 2002
- [j2]Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen:
Optical diagnosis of excess IDDQ in low power CMOS circuits. Microelectron. Reliab. 42(9-11): 1689-1694 (2002) - 2001
- [j1]Franco Stellari, Franco Zappa, Sergio Cova, L. Vendrame:
Tools for contactless testing and simulation of CMOS circuits. Microelectron. Reliab. 41(11): 1801-1808 (2001)
Coauthor Index
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