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ORCID28th NATW 2019: Burlington, VT, USA
- 28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019. IEEE 2019, ISBN 978-1-7281-3382-9
- Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert:
Case Study of Advanced Diagnostic Techniques for Multi Port Register File. 1-9 - Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. 1-6 - Weize Yu, Yiming Wen:
Malicious Attacks on Physical Unclonable Function Sensors of Internet of Things. 1-6 - Mark Fosberry, Ben McMahon:
Matlab JTAG AXI Master opens new dimensions for development and testability. 1-2 - Eric Hunt-Schroeder, Darren Anand, Edward Hwang, Aaron Cummings, Matthew Deming, Michael Roberge, Michael Ziegerhofer:
Behavioral Modeling of a Charge Trap Transistor One Time Programmable Memory. 1-6 - Yiming Wen, Weize Yu:
Convolutional Neural Networks (CNNs)-Assisted Voltage Regulation: A New Power Delivery Scheme. 1-6
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