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2010 – 2019
- 2018
[c19]Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song:
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS 2018: 6- 2015
- [c18]Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay:
Time-integrated photon emission as a function of temperature in 32 nm CMOS. IRPS 2015: 2 - [c17]Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song:
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS 2015: 2 - [c16]Emily Ray, Barry P. Linder, Raphael Robertazzi, Kevin Stawiasz, Alan J. Weger, Emmanuel Yashchin, James H. Stathis, Peilin Song:
Analyzing path delays for accelerated testing of logic chips. IRPS 2015: 6 - 2014
- [c15]Franco Stellari, Peilin Song, Alan J. Weger, Jim Culp, A. Herbert, Dirk Pfeiffer:
Verification of untrusted chips using trusted layout and emission measurements. HOST 2014: 19-24 - [c14]Peilin Song, Franco Stellari, Alan J. Weger:
Counterfeit IC detection using light emission. ITC 2014: 1-8 - 2012
- [c13]Pradip Bose, Alper Buyuktosunoglu, John A. Darringer, Meeta Sharma Gupta, Michael B. Healy, Hans M. Jacobson, Indira Nair, Jude A. Rivers, Jeonghee Shin, Augusto Vega, Alan J. Weger:
Power management of multi-core chips: Challenges and pitfalls. DATE 2012: 977-982 - 2011
- [c12]Jeonghee Shin, John A. Darringer, Guojie Luo, Alan J. Weger, Charles L. Johnson:
Early chip planning cockpit. DATE 2011: 863-866 - [c11]Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt:
MARVEL - Malicious alteration recognition and verification by emission of light. HOST 2011: 117-121 - 2010
- [c10]Pradip Bose, Alper Buyuktosunoglu, Chen-Yong Cher, John A. Darringer, Meeta Sharma Gupta, Hendrik F. Hamann, Hans M. Jacobson, Prabhakar Kudva, Eren Kursun, Niti Madan, Indira Nair, Jude A. Rivers, Jeonghee Shin, Alan J. Weger, Victor V. Zyuban:
Power-efficient, reliable microprocessor architectures: modeling and design methods. ACM Great Lakes Symposium on VLSI 2010: 299-304
2000 – 2009
- 2008
- [c9]Ruchir Puri, Devadas Varma, Darvin Edwards, Alan J. Weger, Paul D. Franzon
, Andrew Yang, Stephen V. Kosonocky:
Keeping hot chips cool: are IC thermal problems hot air? DAC 2008: 634-635 - 2007
- [j4]Hendrik F. Hamann, Alan J. Weger, James A. Lacey, Zhigang Hu, Pradip Bose, Erwin B. Cohen, Jamil A. Wakil:
Hotspot-Limited Microprocessors: Direct Temperature and Power Distribution Measurements. IEEE J. Solid State Circuits 42(1): 56-65 (2007) - [c8]Jeonghwan Choi, Chen-Yong Cher, Hubertus Franke, Hendrik F. Hamann, Alan J. Weger, Pradip Bose:
Thermal-aware task scheduling at the system software level. ISLPED 2007: 213-218 - [c7]Hendrik F. Hamann, Alan J. Weger, James A. Lacey, Zhigang Hu, Pradip Bose, Erwin B. Cohen, Jamil A. Wakil:
Temperature-limited microprocessors: Measurements and design implications. VLSI Design 2007: 427-432 - 2006
- [c6]Hendrik F. Hamann, Alan J. Weger, James A. Lacey, Erwin B. Cohen, Craig Atherton:
Power Distribution Measurements of the Dual Core PowerPCTM 970MP Microprocessor. ISSCC 2006: 2172-2179 - [c5]Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steven C. Wilson, John Pennings, Richard F. Rizzolo:
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. ITC 2006: 1-10 - 2005
- [j3]Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song:
Photon emission microscopy of inter/intra chip device performance variations. Microelectron. Reliab. 45(9-11): 1471-1475 (2005) - [c4]Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus:
An advanced optical diagnostic technique of IBM z990 eServer microprocessor. ITC 2005: 9 - 2004
- [c3]Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho:
CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC 2004: 134-139 - [c2]Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia:
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. ITC 2004: 140-147 - 2003
- [j2]Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steven C. Wilson:
Latchup Analysis Using Emission Microscopy. Microelectron. Reliab. 43(9-11): 1603-1608 (2003) - [j1]Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43(9-11): 1663-1668 (2003) - [c1]Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
Coauthor Index
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