"Photon emission microscopy of inter/intra chip device performance variations."

Stas Polonsky et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.031

access: closed

type: Journal Article

metadata version: 2020-02-22

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Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song:
Photon emission microscopy of inter/intra chip device performance variations. Microelectron. Reliab. 45(9-11): 1471-1475 (2005)

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