"CMOS circuit testing via time-resolved luminescence measurements and ..."

Franco Stellari et al. (2004)

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DOI: 10.1109/TIM.2003.822195

access: closed

type: Journal Article

metadata version: 2020-06-08

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Franco Stellari, Alberto Tosi, Franco Zappa, Sergio Cova:
CMOS circuit testing via time-resolved luminescence measurements and simulations. IEEE Trans. Instrum. Meas. 53(1): 163-169 (2004)

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