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ORCID14th EMC Compo 2024: Torino, Italy
- 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024, Torino, Italy, October 7-9, 2024. IEEE 2024, ISBN 979-8-3315-0463-2
- Markeljan Fishta, Pietro Montorsi, Franco Fiori:
A Critical Analysis of Amplifier Requirements in Capacitance-Boosting Circuits for EMI Reduction. 1-5 - Sergey Miropolsky, Frank Klotz:
Analysis of Partial RF Emission Spectra of IC Functions and Subcircuits on the Example of Power Switch ICs. 1-5 - Dominik Kreindl, Bernhard Weiss, Christian Stockreiter, Thomas Bauernfeind, Manfred Kaltenbacher:
A Simulation Workflow for Predicting IC Stripline Radiated Emissions of Bond Wire-Based Systems. 69-73 - Daisuke Fujimoto, Taichi Sato, Yuichi Hayashi:
Current Consumption Modeling of Logic Cells Based on Measurements for Side-channel Attack Simulation. 1-4 - Kazuki Shimada, Mototsugu Okushima:
On-Chip ESD Current Sensor for Nanosecond Oscillation Waveform Over Ampere Detecting. 46-50 - Norbert Seliger, Nico Leirich:
Reconfigurable Board-to-Board Interconnect Utilizing Bistable Compliant Ribbon Wires. 1-5 - Stefan Jahn:
Functional Failures in a Sensor Application caused by System-level ESD. 145-149 - Matthieu Laidet, Alexandre Boyer, Julien Gazave, Sonia Ben Dhia:
Accelerated characterisation of Operational Amplifiers' susceptibility using multitone disturbance. 51-55 - Hyun Ho Park, Jiseong Kim, Eakhwan Song, Hongseok Kim, Sangho Cho:
Influence of Sensing Resistor on IC-level Noise Measurement of DC-DC Converters by 1 Ω Method. 33-36 - Alexander Schade, Frank Klotz, Robert Weigel:
Automated Method to Synthesize RLCK-Circuits from S-Parameters. 1-8 - Takuya Wadatsumi, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Lang Lin, Norman Chang, Makoto Nagata:
Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection. 1-4 - Tomas Monopoli, Xinglong Wu, Sergio Amedeo Pignari, Johannes Wolf, Flavia Grassi:
Inspection tools for Gaussian Process Regression Modeling of Electromagnetic Fields of Electronic Boards and Chips. 56-59 - Ruiqi Dai, Yuhao Xu, Jiarui Qiu, Hanzhi Ma, Er-Ping Li:
High-Fidelity S-Parameter Prediction Using Transfer Learning Based Encoder-Decoder Model. 80-83 - Louis Cesbron Lavau, Michael Suhrke, Peter Knott:
Assessing IEMI Vulnerabilities in MEMS Barometers: A Comparative Approach. 119-123 - Shih-Yi Yuan, Shin-Hsien Chiang, Yun-Ling Wang, Liang-Yang Lin, Yuan-Fu Ku:
Clock Signal Recovery Algorithm for FPGA-based Microcontroller Near-Field EMI Measurement and Processing. 1-5 - Yuki Kaneko, Yuichi Hayashi, Naofumi Homma:
Experimental Evaluation for Detecting Aging Effect on Microcontrollers based on Side-Channel Analysis. 1-5 - Mouette Anselme, Toulemont Julien, Raoult Jérémy, Maurine Philippe:
Butterfly probes: estimating the derivative of the magnetic flux. 29-32 - Maurizio Tranchero, Marco Garelli:
Measurement of PCB-Related Commutation-Loop Inductance Using a Vector Network Analyzer. 1-4 - Francesco de Paulis, Faye Squires, Yifan Ding, Matteo Cocchini, Matthew Doyle, Samuel Connor, Albert E. Ruehli, Chulsoon Hwang, Lijun Jiang:
Suppression of Power Distribution Network PCB-Package Resonance for Low Target Impedance. 1-3 - Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador:
Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform. 1-6 - Rohit Halba, Pawan Kumar Gupta:
SPICE based SI-PI co-simulation Framework to optimize Die-Package-PCB to meet LPDDR5(x) Performance in Automotive and Edge MPU-MCU. 1-4 - Nikolaus Czepl, Dominik Zupan, Alicja Michalowska-Forsyth, Bernd Deutschmann:
Effects of Ionizing Radiation on the EMI-Induced Offset Voltage of Operational Amplifiers. 111-115 - Ledong Chen, Jianfei Wu, Changlin Han, Honghai Liu, Xuesong Wang, Jibin Liu:
Research and Application Progress on Electromagnetic Reliability of Integrated Circuits in the Past Decade. 1-5 - Koki Abe, Daisuke Fujimoto, Yuichi Hayashi:
Fundamental Study on Detecting Hardware Trojans in Printed Circuit Boards Using Ring Oscillators. 1-4 - Marco Pfeifer, Ko Odreitz, Bernd Deutschmann:
Evaluation of the Electromagnetic Emission of ICs Using Different Spread Spectrum Approaches. 106-110 - Chen Liu, Frede Blaabjerg, Pooya Davari:
DM EMI Noise Prediction for BCM based Single-Phase Grid-Connected Inverter. 1-5 - Arunkumar H. Venkateshaiah, John F. Dawson, Martin A. Trefzer, Simon J. Bale, Andrew C. Marvin, Martin P. Robinson:
Design and Application of RFIC Detector: To Measure Coupled Power into IC Pin via PCB Trace. 42-45 - Mohit Singh Choudhary, Jean-Michel Redoute, Maryam Shojaei Baghini:
Comprehensive Study of EMI Effects on Wireline Transceiver Systems: A review of silicon-proven techniques. 100-105 - Daniel Kircher, Cristian Ionascu, Bernd Deutschmann:
EMI Robust Comparator Design for Protection Features of Smart Power Switches. 92-95 - T. Billaux, J. Raoult, P. Hoffmann:
Analyzing and Modeling of the Susceptibility to Temporary Malfunction in Automatic Gain Control Loops. 11-14 - Matthias Schulz, Michael Kopf:
Passive DC-input and DC-input/AC-output EMI filter for DC-AC inverter. 1-6 - Jun Imaoka, Mamoru Sasaki, Yasumichi Omoto, Mostafa Noah, Koichi Shigematsu, Masayoshi Yamamoto:
Common Mode Noise Reduction Methods Used for High Power Density DC/DC Converters. 1-6 - Kamel Abouda, Matthew Bacchi:
System-on-chip preventing discharge of bootstrap capacitor of high-side drivers. 19-23 - Soazig Le Bihan, Tristan Dubois, Jean-Baptiste Bégueret, Adil El Abbazi:
Enhancing High-Speed Ethernet Link Design at 25 Gbps in Aerospace Environments Through Optimization Algorithms. 74-79 - Hiraku Uehara, Koh Watanabe, Sosuke Ashida, Yushi Mitsuya, Satoshi Tanaka, Makoto Nagata:
Accuracy of GPS Positioning Measurements in response to Electromagnetic Noise Characteristics. 116-118 - Dominik Zupan, Nikolaus Czepl, Bernd Deutschmann:
Characterisation of an EMI-Improved Integrated Folded Cascode Amplifier Structure Using the EMIRR Measurement Method. 1-4 - Subrahmanyam Boyapati:
Modeling and Design of Highly EMI Immune CMOS OpAmp Topologies. 84-91 - Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi:
Controlling Faulty Byte Outputs with IEMI against Cryptographic ICs. 1-5 - Md. Moktarul Alam, Richard Perdriau, Mohammed Ramdani, Mohsen Koohestani:
A Case Study for the EMC Co-Simulation of Injection Path Model Using WR Method. 64-68 - Andree Scambor, Christoph Maier:
Investigations on Microstrip and Ground Plane Partial Inductance in Finite-Width Structures. 1-5 - A. Boyer, Fabrice Caignet:
Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance. 5-10 - Hidetake Sugo, Norimasa Oka, Takaya Nagai, Koji Hattori, Takeshi Matsuzaki:
An ICIM-CI Model for Mass Production Development Considering Manufacturing Variations. 60-63 - Alexander Schade, Frank Klotz, Robert Weigel:
Loop Inductance Based RLCK Models of PCBs and IC-Packages in Practice. 1-8 - A. Rosa, Anna Richelli, Luigi Colalongo:
EMI Immunity of the Nauta Inverter-Based Amplifier. 15-18 - Musab Hameed, Abraham Reithofer, Gabriel Fellner, Ahmad Hosseinbeig, David Pommerenke:
Analysis, Testing and Comparison of Different Commercial ESD Detectors. 1-6 - Simone Negri, Xiaokang Liu, Giordano Spadacini, Flavia Grassi, Sergio Amedeo Pignari, Aurora Sanna, Damian Halicki:
Investigation on the Effect of Different Form Factors on the Performance of Miniaturized Transformers. 1-4 - Takashi Nomura, Mitsuhiro Hasegawa, Ko Oyama, Yosuke Kondo, Koji Ichikawa:
Evaluation of Ground Terminal against Noise by Direct Power Injection Method. 24-28 - Alberto Barbaro, Markeljan Fishta, Erica Raviola, Franco Fiori:
A Comparison of Spread Spectrum and Sigma Delta Modulations to Mitigate Conducted EMI in GaN-Based DC-DC Converters. 1-6 - Jeremy Ruau, Bertrand Vrignon, Christophe Menard, Lucy Liu, Matthieu Baudry:
Near field scan investigation method to reduce 4.8 GHz emission on a BLE application. 37-41 - Jianfei Wu, Yanfang Lu, Yang Li, Hongli Zhang, Yiming Zhang, Xing Zhao, Wei Zhu:
STT-MRAM Based ESD and EFT Immunity Analysis. 96-99
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