"Modeling and Analysis of On-Chip Voltage Fluctuations Caused by ..."

Takuya Wadatsumi et al. (2024)

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DOI: 10.1109/EMCCOMPO61192.2024.10742019

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-22

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Takuya Wadatsumi, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Lang Lin, Norman Chang, Makoto Nagata:
Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection. EMC Compo 2024: 1-4

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