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2020 – today
- 2024
[c1]A. Boyer, Fabrice Caignet:
Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance. EMC Compo 2024: 5-10- 2021
- [j10]Alexandre Boyer
, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia:
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70: 1-15 (2021)
2010 – 2019
- 2017
- [j9]Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur:
Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectron. Reliab. 76-77: 685-691 (2017) - 2016
- [j8]Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur:
Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectron. Reliab. 64: 88-92 (2016) - 2015
- [j7]Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran:
20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectron. Reliab. 55(11): 2276-2283 (2015) - 2014
- [j6]Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet:
Reliability of ESD protection devices designed in a 3D technology. Microelectron. Reliab. 54(9-10): 2272-2277 (2014) - 2013
- [j5]Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur:
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. Microelectron. Reliab. 53(2): 221-228 (2013) - [j4]Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran:
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectron. Reliab. 53(9-11): 1278-1283 (2013)
2000 – 2009
- 2008
- [j3]Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi:
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectron. J. 39(12): 1728-1735 (2008) - 2001
- [j2]Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard:
The challenge of signal integrity in deep-submicrometer CMOS technology. Proc. IEEE 89(4): 556-573 (2001) - 2000
- [j1]Fabrice Caignet, S. D.-B. Dhia, Etienne Sicard:
On the measurement of crosstalk in integrated circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(5): 606-609 (2000)
Coauthor Index
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