"Functional Failures in a Sensor Application caused by System-level ESD."

Stefan Jahn (2024)

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DOI: 10.1109/EMCCOMPO61192.2024.10742014

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-22

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Stefan Jahn:
Functional Failures in a Sensor Application caused by System-level ESD. EMC Compo 2024: 145-149

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