"Experimental Evaluation for Detecting Aging Effect on Microcontrollers ..."

Yuki Kaneko, Yuichi Hayashi, Naofumi Homma (2024)

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DOI: 10.1109/EMCCOMPO61192.2024.10742051

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-22

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Yuki Kaneko, Yuichi Hayashi, Naofumi Homma:
Experimental Evaluation for Detecting Aging Effect on Microcontrollers based on Side-Channel Analysis. EMC Compo 2024: 1-5

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