• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 68 matches

• 2018
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 34(1): 1 (2018)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 34(2): 105 (2018)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 34(3): 209 (2018)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 34(4): 371-372 (2018)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 34(5): 507-508 (2018)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 34(6): 615-617 (2018)
• 
  Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard:
  Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. J. Electron. Test. 34(6): 749-762 (2018)
• 
  Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena-Ioana Vatajelu:
  Test and Reliability in Approximate Computing. J. Electron. Test. 34(4): 375-387 (2018)
• 
  Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini:
  Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34(1): 43-52 (2018)
• 
  Xu Bai, Hui Hu, Wanjun Li, Fulu Liu:
  Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT. J. Electron. Test. 34(6): 643-650 (2018)
• 
  Ahcène Bounceur, Samia Djemai, Belkacem Brahmi, Mohand Ouamer Bibi, Reinhardt Euler:
  A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters. J. Electron. Test. 34(3): 321-335 (2018)
• 
  Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie:
  Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. J. Electron. Test. 34(5): 547-557 (2018)
• 
  Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard:
  On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34(3): 281-290 (2018)
• 
  Vaishali H. Dhare, Usha Sandeep Mehta:
  Multiple Missing Cell Defect Modeling for QCA Devices. J. Electron. Test. 34(6): 623-641 (2018)
• 
  Roya Dibaj, Dhamin Al-Khalili, Maitham Shams:
  Gate Oxide Short Defect Model in FinFETs. J. Electron. Test. 34(3): 351-362 (2018)
• 
  Aydin Dirican, Cagatay Ozmen, Martin Margala:
  Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout Regulators. J. Electron. Test. 34(4): 405-415 (2018)
• 
  Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu:
  A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error. J. Electron. Test. 34(6): 717-733 (2018)
• 
  Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu:
  FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. J. Electron. Test. 34(1): 15-25 (2018)
• 
  Rana Elnaggar, Krishnendu Chakrabarty:
  Machine Learning for Hardware Security: Opportunities and Risks. J. Electron. Test. 34(2): 183-201 (2018)
• 
  Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac:
  Detectability Challenges of Bridge Defects in FinFET Based Logic Cells. J. Electron. Test. 34(2): 123-134 (2018)
• 
  Yong Gao, En Li, Gaofeng Guo:
  Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity. J. Electron. Test. 34(2): 203-207 (2018)
• 
  B. Mert Gönültas, Janset Savas, Ramin Khayatzadeh, Sacid Aygün, Fehmi Çivitci, Y. Daghan Gökdel, M. Berke Yelten, Onur Ferhanoglu:
  Reliability Testing of 3D-Printed Electromechanical Scanning Devices. J. Electron. Test. 34(3): 363-370 (2018)
• 
  Abdus Sami Hassan, Tooba Arifeen, Hossein Moradian, Jeong-A Lee:
  Generation Methodology for Good-Enough Approximate Modules of ATMR. J. Electron. Test. 34(6): 651-665 (2018)
• 
  Ke Huang, Manuel J. Barragán:
  Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing. J. Electron. Test. 34(3): 213-214 (2018)
• 
  Riadul Islam:
  Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops. J. Electron. Test. 34(4): 471-485 (2018)
• 
  Wei Jiang, Guoan Wang:
  A Simplified Calibration Methodology for On-Chip Couplers. J. Electron. Test. 34(6): 763-768 (2018)
• 
  R. Jothin, C. Vasanthanayaki:
  High Performance Static Segment On-Chip Memory for Image Processing Applications. J. Electron. Test. 34(4): 389-404 (2018)
• 
  R. Jothin, C. Vasanthanayaki:
  High Performance Modified Static Segment Approximate Multiplier based on Significance Probability. J. Electron. Test. 34(5): 607-614 (2018)
• 
  Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang:
  Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. J. Electron. Test. 34(3): 337-349 (2018)
• 
  Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley:
  Impact of Aging on the Reliability of Delay PUFs. J. Electron. Test. 34(5): 571-586 (2018)

skipping 38 more matches