"Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning."

Parth Kansara et al. (2018)

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DOI: 10.1007/S10836-018-5724-Y

access: closed

type: Journal Article

metadata version: 2023-03-03

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Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang:
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. J. Electron. Test. 34(3): 337-349 (2018)

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