"Gate Oxide Short Defect Model in FinFETs."

Roya Dibaj, Dhamin Al-Khalili, Maitham Shams (2018)

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DOI: 10.1007/S10836-018-5727-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Roya Dibaj, Dhamin Al-Khalili, Maitham Shams:
Gate Oxide Short Defect Model in FinFETs. J. Electron. Test. 34(3): 351-362 (2018)

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