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Publication search results
found 68 matches
- 2020
- Naznin Akter, Mustafa Karabiyik, Michael S. Shur, John Suarez, Nezih Pala:
AI Powered THz VLSI Testing Technology. NATW 2020: 1-5 - Marcia Golmohamadi, Ryan Jurasek, Wolfgang Hokenmaier, Donald Labrecque, Ruoyu Zhi, Bret Dale, Nibir Islam, Dave Kinney, Angela Johnson:
Verification and Testing Considerations of an In-Memory AI Chip. NATW 2020: 1-6 - Joshua Immanuel, Spencer K. Millican:
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. NATW 2020: 1-6 - Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome:
Passive Intermodulation (PIM) Test and Measurement. NATW 2020: 1-3 - Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min:
Self-heating characterization and its applications in technology development. NATW 2020: 1-7 - Konstantinos Poulos, Themistoklis Haniotakis:
A Built In Test circuit for waveform classification at high frequencies. NATW 2020: 1-5 - Stewart E. Rauch, Dongho Lee, Alexey Vert, Roy Gupta:
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. NATW 2020: 1-4 - 29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020. IEEE 2020, ISBN 978-1-7281-9699-2 [contents]
- 2019
- Mark Fosberry, Ben McMahon:
Matlab JTAG AXI Master opens new dimensions for development and testability. NATW 2019: 1-2 - Eric Hunt-Schroeder, Darren Anand, Edward Hwang, Aaron Cummings, Matthew Deming, Michael Roberge, Michael Ziegerhofer:
Behavioral Modeling of a Charge Trap Transistor One Time Programmable Memory. NATW 2019: 1-6 - Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. NATW 2019: 1-6 - Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert:
Case Study of Advanced Diagnostic Techniques for Multi Port Register File. NATW 2019: 1-9 - Yiming Wen, Weize Yu:
Convolutional Neural Networks (CNNs)-Assisted Voltage Regulation: A New Power Delivery Scheme. NATW 2019: 1-6 - Weize Yu, Yiming Wen:
Malicious Attacks on Physical Unclonable Function Sensors of Internet of Things. NATW 2019: 1-6 - 28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019. IEEE 2019, ISBN 978-1-7281-3382-9 [contents]
- 2018
- Imtiaz Ahmed, Subhash Baraiya, Rahul Singhal:
Case study on low pin count testing of industry transceiver chip. NATW 2018: 1-5 - Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard:
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW 2018: 1-8 - Mehmet Ince, Ender Yilmaz, Sule Ozev:
Enabling fast process variation and fault simulation through macromodelling of analog components. NATW 2018: 1-6 - Wei Jiang, Guoan Wang:
A simplified on-chip calibration method for branch-line coupler. NATW 2018: 1-3 - Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak:
One more time! Increasing fault detection with scan shift capture. NATW 2018: 1-7 - Ryan Pennucci, Ryan Jurasek, Wolfgang Hokenmaier, Lester Patrick, Jacob Bucci, Donald Labrecque, David Kinney:
An analysis of an inexpensive memory test solution. NATW 2018: 1-6 - Timothy M. Platt, Chen Liu:
Reducing test time with FPGA accelerators using OpenCL. NATW 2018: 1-9 - Michael S. Shur, John Suarez:
Nanoscale silicon mosfet response to THz radiation for testing VLSI. NATW 2018: 1-6 - 27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018. IEEE 2018, ISBN 978-1-5386-6400-1 [contents]
- 2017
- Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch:
Detecting a trojan die in 3D stacked integrated circuits. NATW 2017: 1-6 - Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch:
Mitigating simple power analysis attacks on LSIB key logic. NATW 2017: 1-6 - Yu Huang:
Case study of bandwidth management in SoC testing. NATW 2017: 1-6 - Konstantinos Poulos, Jayasurya Kuchi, Themistoklis Haniotakis:
An enhanced approach to reduce test application time through limited shift operations in scan chains. NATW 2017: 1-4 - Pavithra Ramesh, Vinay C. Patil, Sandip Kundu:
Peer pressure on identity: On requirements for disambiguating PUFs in noisy environment. NATW 2017: 1-4 - 2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. IEEE 2017, ISBN 978-1-5090-5902-7 [contents]
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