"New testing approach using near electromagnetic field probing intending to ..."

Nabil El Belghiti Alaoui et al. (2018)

> Home

Details and statistics

DOI: 10.1109/NATW.2018.8388867

access: closed

type: Conference or Workshop Paper

metadata version: 2020-01-31

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/natw/AlaouiTBV18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/natw/AlaouiTBV18
Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard:
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW 2018: 1-8

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.