"Case study on low pin count testing of industry transceiver chip."

Imtiaz Ahmed, Subhash Baraiya, Rahul Singhal (2018)

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DOI: 10.1109/NATW.2018.8388868

access: closed

type: Conference or Workshop Paper

metadata version: 2020-01-31

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Imtiaz Ahmed, Subhash Baraiya, Rahul Singhal:
Case study on low pin count testing of industry transceiver chip. NATW 2018: 1-5

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