- 2024
- Koki Abe, Daisuke Fujimoto, Yuichi Hayashi:
Fundamental Study on Detecting Hardware Trojans in Printed Circuit Boards Using Ring Oscillators. EMC Compo 2024: 1-4 - Kamel Abouda, Matthew Bacchi:
System-on-chip preventing discharge of bootstrap capacitor of high-side drivers. EMC Compo 2024: 19-23 - Md. Moktarul Alam, Richard Perdriau, Mohammed Ramdani, Mohsen Koohestani:
A Case Study for the EMC Co-Simulation of Injection Path Model Using WR Method. EMC Compo 2024: 64-68 - Mouette Anselme, Toulemont Julien, Raoult Jérémy, Maurine Philippe:
Butterfly probes: estimating the derivative of the magnetic flux. EMC Compo 2024: 29-32 - Alberto Barbaro, Markeljan Fishta, Erica Raviola, Franco Fiori:
A Comparison of Spread Spectrum and Sigma Delta Modulations to Mitigate Conducted EMI in GaN-Based DC-DC Converters. EMC Compo 2024: 1-6 - Soazig Le Bihan, Tristan Dubois, Jean-Baptiste Bégueret, Adil El Abbazi:
Enhancing High-Speed Ethernet Link Design at 25 Gbps in Aerospace Environments Through Optimization Algorithms. EMC Compo 2024: 74-79 - T. Billaux, J. Raoult, P. Hoffmann:
Analyzing and Modeling of the Susceptibility to Temporary Malfunction in Automatic Gain Control Loops. EMC Compo 2024: 11-14 - Subrahmanyam Boyapati:
Modeling and Design of Highly EMI Immune CMOS OpAmp Topologies. EMC Compo 2024: 84-91 - A. Boyer, Fabrice Caignet:
Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance. EMC Compo 2024: 5-10 - Ledong Chen, Jianfei Wu, Changlin Han, Honghai Liu, Xuesong Wang, Jibin Liu:
Research and Application Progress on Electromagnetic Reliability of Integrated Circuits in the Past Decade. EMC Compo 2024: 1-5 - Mohit Singh Choudhary, Jean-Michel Redoute, Maryam Shojaei Baghini:
Comprehensive Study of EMI Effects on Wireline Transceiver Systems: A review of silicon-proven techniques. EMC Compo 2024: 100-105 - Nikolaus Czepl, Dominik Zupan, Alicja Michalowska-Forsyth, Bernd Deutschmann:
Effects of Ionizing Radiation on the EMI-Induced Offset Voltage of Operational Amplifiers. EMC Compo 2024: 111-115 - Ruiqi Dai, Yuhao Xu, Jiarui Qiu, Hanzhi Ma, Er-Ping Li:
High-Fidelity S-Parameter Prediction Using Transfer Learning Based Encoder-Decoder Model. EMC Compo 2024: 80-83 - Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador:
Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform. EMC Compo 2024: 1-6 - Markeljan Fishta, Pietro Montorsi, Franco Fiori:
A Critical Analysis of Amplifier Requirements in Capacitance-Boosting Circuits for EMI Reduction. EMC Compo 2024: 1-5 - Daisuke Fujimoto, Taichi Sato, Yuichi Hayashi:
Current Consumption Modeling of Logic Cells Based on Measurements for Side-channel Attack Simulation. EMC Compo 2024: 1-4 - Rohit Halba, Pawan Kumar Gupta:
SPICE based SI-PI co-simulation Framework to optimize Die-Package-PCB to meet LPDDR5(x) Performance in Automotive and Edge MPU-MCU. EMC Compo 2024: 1-4 - Musab Hameed, Abraham Reithofer, Gabriel Fellner, Ahmad Hosseinbeig, David Pommerenke:
Analysis, Testing and Comparison of Different Commercial ESD Detectors. EMC Compo 2024: 1-6 - Jun Imaoka, Mamoru Sasaki, Yasumichi Omoto, Mostafa Noah, Koichi Shigematsu, Masayoshi Yamamoto:
Common Mode Noise Reduction Methods Used for High Power Density DC/DC Converters. EMC Compo 2024: 1-6 - Stefan Jahn:
Functional Failures in a Sensor Application caused by System-level ESD. EMC Compo 2024: 145-149 - Yuki Kaneko, Yuichi Hayashi, Naofumi Homma:
Experimental Evaluation for Detecting Aging Effect on Microcontrollers based on Side-Channel Analysis. EMC Compo 2024: 1-5 - Daniel Kircher, Cristian Ionascu, Bernd Deutschmann:
EMI Robust Comparator Design for Protection Features of Smart Power Switches. EMC Compo 2024: 92-95 - Dominik Kreindl, Bernhard Weiss, Christian Stockreiter, Thomas Bauernfeind, Manfred Kaltenbacher:
A Simulation Workflow for Predicting IC Stripline Radiated Emissions of Bond Wire-Based Systems. EMC Compo 2024: 69-73 - Matthieu Laidet, Alexandre Boyer, Julien Gazave, Sonia Ben Dhia:
Accelerated characterisation of Operational Amplifiers' susceptibility using multitone disturbance. EMC Compo 2024: 51-55 - Louis Cesbron Lavau, Michael Suhrke, Peter Knott:
Assessing IEMI Vulnerabilities in MEMS Barometers: A Comparative Approach. EMC Compo 2024: 119-123 - Chen Liu, Frede Blaabjerg, Pooya Davari:
DM EMI Noise Prediction for BCM based Single-Phase Grid-Connected Inverter. EMC Compo 2024: 1-5 - Sergey Miropolsky, Frank Klotz:
Analysis of Partial RF Emission Spectra of IC Functions and Subcircuits on the Example of Power Switch ICs. EMC Compo 2024: 1-5 - Tomas Monopoli, Xinglong Wu, Sergio Amedeo Pignari, Johannes Wolf, Flavia Grassi:
Inspection tools for Gaussian Process Regression Modeling of Electromagnetic Fields of Electronic Boards and Chips. EMC Compo 2024: 56-59 - Simone Negri, Xiaokang Liu, Giordano Spadacini, Flavia Grassi, Sergio Amedeo Pignari, Aurora Sanna, Damian Halicki:
Investigation on the Effect of Different Form Factors on the Performance of Miniaturized Transformers. EMC Compo 2024: 1-4 - Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi:
Controlling Faulty Byte Outputs with IEMI against Cryptographic ICs. EMC Compo 2024: 1-5
