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2020 – today
- 2024
[c8]Hiroyuki Iwata, Mahmoud AbdAlwahab, Ron Press, Ohki Sugiura:
Short Paper: Bus-based Packetized Scan Architecture Trade-offs for Heterogeneous Multi-Core SoCs. ITC 2024: 61-65
2010 – 2019
- 2017
- [c7]Yoichi Maeda, Jun Matsushima, Ron Press:
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. ATS 2017: 237-241 - 2016
- [j3]Ron Press
, Li-C. Wang:
ITC and the Future of Test - We've Won. IEEE Des. Test 33(6): 96 (2016) - 2010
- [j2]Ron Press, Erik H. Volkerink:
The ABCs of ITC. IEEE Des. Test Comput. 27(5): 80 (2010) - [e1]Ron Press, Erik H. Volkerink:
2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-7206-2 [contents]
2000 – 2009
- 2009
- [c6]Dragon Hsu, Ron Press:
Scan Compression Implementation in Industrial Design - Case Study. Asian Test Symposium 2009: 83-84 - 2007
- [i1]Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press:
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. CoRR abs/0710.4763 (2007) - 2006
- [c5]Greg Aldrich, Ron Press, Takeo Kobayashi, Tatsuo Sakajiri:
Mentor Graphics DFT to Navigate Nanometer Test Challenges. ATS 2006: 130 - [c4]Ron Press, Jay Jahangiri:
The Demand and Practical Approach for 100x Test Compression. VLSI-SoC 2006: 245-250 - 2005
- [c3]Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press:
Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317 - [c2]Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press:
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61 - [c1]Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press:
Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228 - 2003
- [j1]Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli:
High-Frequency, At-Speed Scan Testing. IEEE Des. Test Comput. 20(5): 17-25 (2003)
Coauthor Index
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