"Automotive IC On-line Test Techniques and the Application of Deterministic ..."

Yoichi Maeda, Jun Matsushima, Ron Press (2017)

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DOI: 10.1109/ATS.2017.52

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoichi Maeda, Jun Matsushima, Ron Press:
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. ATS 2017: 237-241

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