"High-Frequency, At-Speed Scan Testing."

Xijiang Lin et al. (2003)

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DOI: 10.1109/MDT.2003.1232252

access: closed

type: Journal Article

metadata version: 2020-05-17

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Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli:
High-Frequency, At-Speed Scan Testing. IEEE Des. Test Comput. 20(5): 17-25 (2003)

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