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Yunpeng Jia
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2020 – today
- 2024
- [j6]Yunpeng Jia, Xiufen Ye, Yusong Liu, Shuxiang Guo:
Multi-modal recursive prompt learning with mixup embedding for generalization recognition. Knowl. Based Syst. 294: 111726 (2024) - [j5]Yunpeng Jia, Xiufen Ye, Xinkui Mei, Yusong Liu, Shuxiang Guo:
MLTU: mixup long-tail unsupervised zero-shot image classification on vision-language models. Multim. Syst. 30(3): 169 (2024) - [c15]Yufei Han, Heng Guo, Koki Fukai, Hiroaki Santo, Boxin Shi, Fumio Okura, Zhanyu Ma, Yunpeng Jia:
NeRSP: Neural 3D Reconstruction for Reflective Objects with Sparse Polarized Images. CVPR 2024: 11821-11830 - [i1]Yufei Han, Heng Guo, Koki Fukai, Hiroaki Santo, Boxin Shi, Fumio Okura, Zhanyu Ma, Yunpeng Jia:
NeRSP: Neural 3D Reconstruction for Reflective Objects with Sparse Polarized Images. CoRR abs/2406.07111 (2024) - 2023
- [j4]Chuanlong Li, Xiufen Ye, Jier Xi, Yunpeng Jia:
A Texture Feature Removal Network for Sonar Image Classification and Detection. Remote. Sens. 15(3): 616 (2023) - [c14]Shiyu Zhang, Dongqing Hu, Xintian Zhou, Yunpeng Jia, Yu Wu:
Optimized Design of Trench Termination for High-Voltage β-Ga2O3 Trench MOS Barrier Schottky Diode with Anode Electrode Extension. EITCE 2023: 66-72 - [c13]Kang Zhang, Yu Wu, Dongqing Hu, Yunpeng Jia, Xintian Zhou:
Improvement of reverse recovery characteristics through integration of MOS-barrier Schottky diode in SiC superjunction structure. EITCE 2023: 1601-1608 - [c12]Shushan Qu, Mingtong Zhang, Jiaxin Tong, Ruochen Zhang, Yang Liu, Yunpeng Jia, Jie Li, Ningwei Xie:
LWSFACE: Light-Weighted Weakly-Supervised 3D Facial Texture Reconstruction From a Single Image. IC-NIDC 2023: 142-146 - 2022
- [c11]Chongning Zhao, Dongqing Hu, Yuechao Zheng, Yunpeng Jia, Xintian Zhou, Yu Wu, Ting Li:
Design and simulation study of multi-trench termination for 1200V SiC devices with charge coupled drift region. EITCE 2022: 498-502 - [c10]Yuechao Zheng, Dongqing Hu, Chongning Zhao, Yunpeng Jia, Xintian Zhou, Yu Wu, Ting Li:
Simulation study of 1200V SiC-based trench-gate MOSFET with vertical field plate protection. EITCE 2022: 605-610 - [c9]Wangda Wang, Dongqing Hu, Xintian Zhou, Yunpeng Jia, Yu Wu:
A 4H-SiC Trench MOSFET with the vertical field plate coupled floating island and two epi-layers. EITCE 2022: 617-622 - 2021
- [c8]Xingyu Fang, Yunpeng Jia, Xintian Zhou, Xinyu Li, Yingying Lei, Kai Zhao:
A Novel Reverse-Conducting IGBT With Built-In Channel Diode. EITCE 2021: 11-16 - [c7]Jinpeng Zhou, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Yue Tan, Xinyu Li:
Anti-total dose effect design of half-bridge driving chip. EITCE 2021: 76-81 - [c6]Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Xingyu Fang, Zhonghan Deng:
Study on The Degradations Produced by Different P-base Diffusion Temperatures on SGT MOSFET With Approximate Threshold Voltage. EITCE 2021: 226-231 - [c5]Ting Li, Dongqing Hu, Yunpeng Jia, Xintian Zhou, Yu Wu:
3D Simulation Study of Single Event Sensitivity for 200V Planar Gate Power MOSFET. EITCE 2021: 1520-1525 - [c4]Meng Liu, Zhiye Zhang, Jiabao Wen, Yunpeng Jia:
An Approximate Symmetry Clock Tree Design with Routing Topology Prediction. MWSCAS 2021: 92-96 - 2020
- [c3]Yue Tan, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Fujie Zhao, Xinyu Li, Jinpeng Zhou:
Architecture-level Radiation-Hardened design applied to halfbridge GaN driver. EITCE 2020: 891-895 - [c2]Lihao Wang, Yu Wu, Yunpeng Jia, Yuanfu Zhao, Zhonghan Deng:
Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes. EITCE 2020: 965-969 - [c1]Yunpeng Jia, Ziyue Liu, Chuning Wang, Lei Xu:
Research on the Perceptual Interaction Model of Virtual Reality Films. HCI (11) 2020: 236-248
2010 – 2019
- 2019
- [j3]Chuanlong Li, Xiufen Ye, Haibo Yang, Yatong Han, Xiang Li, Yunpeng Jia:
Generalized Zero Shot Learning via Synthesis Pseudo Features. IEEE Access 7: 87827-87836 (2019) - [j2]Xiufen Ye, Haibo Yang, Chuanlong Li, Yunpeng Jia, Peng Li:
A Gray Scale Correction Method for Side-Scan Sonar Images Based on Retinex. Remote. Sens. 11(11): 1281 (2019) - 2018
- [j1]Yunpeng Jia, Zhenhua Lin, Dongqing Hu, Yu Wu, Peng Li, Guanghai Liu:
Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes. Microelectron. Reliab. 82: 37-41 (2018)
Coauthor Index
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last updated on 2024-10-04 21:01 CEST by the dblp team
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