"3D Simulation Study of Single Event Sensitivity for 200V Planar Gate Power ..."

Ting Li et al. (2021)

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DOI: 10.1145/3501409.3501677

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-04

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Ting Li, Dongqing Hu, Yunpeng Jia, Xintian Zhou, Yu Wu:
3D Simulation Study of Single Event Sensitivity for 200V Planar Gate Power MOSFET. EITCE 2021: 1520-1525

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