"Influence of Backside p-Region Width on the Overcurrent Reverse Recovery ..."

Lihao Wang et al. (2020)

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DOI: 10.1145/3443467.3443888

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-04

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Lihao Wang, Yu Wu, Yunpeng Jia, Yuanfu Zhao, Zhonghan Deng:
Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes. EITCE 2020: 965-969

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