"Micro-Raman spectroscopy applied in crystal structure analysis on the ESD ..."

Yunpeng Jia et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.01.001

access: closed

type: Journal Article

metadata version: 2024-04-04

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Yunpeng Jia, Zhenhua Lin, Dongqing Hu, Yu Wu, Peng Li, Guanghai Liu:
Micro-Raman spectroscopy applied in crystal structure analysis on the ESD failure mechanism of SiC JBS diodes. Microelectron. Reliab. 82: 37-41 (2018)

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