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2010 – 2019
- 2019
[j7]Shupeng Sun, Lun Liu
:
Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells. Complex. 2019: 4536012:1-4536012:17 (2019)- 2018
- [j6]Maria Malik, Rajiv V. Joshi, Rouwaida Kanj, Shupeng Sun, Houman Homayoun, Tong Li:
Sparse Regression Driven Mixture Importance Sampling for Memory Design. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 63-72 (2018) - 2017
- [j5]Xiaochen Liu, Shupeng Sun, Xin Li, Haifeng Qian, Pingqiang Zhou:
Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(3): 421-434 (2017) - 2016
- [j4]Fa Wang, Paolo Cachecho, Wangyang Zhang, Shupeng Sun, Xin Li, Rouwaida Kanj, Chenjie Gu:
Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(8): 1255-1268 (2016) - 2015
- [j3]Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu:
Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(7): 1096-1109 (2015) - [c10]Shupeng Sun, Xin Li:
Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space. ASP-DAC 2015: 302-307 - [c9]Shupeng Sun, Xin Li:
Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space. CICC 2015: 1-4 - [c8]Xiaochen Liu, Shupeng Sun, Pingqiang Zhou, Xin Li, Haifeng Qian:
A statistical methodology for noise sensor placement and full-chip voltage map generation. DAC 2015: 94:1-94:6 - 2014
- [j2]Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileggi, Arun Natarajan, Mark A. Ferriss, Jean-Olivier Plouchart, Bodhisatwa Sadhu, Benjamin D. Parker, Alberto Valdes-Garcia, Mihai A. T. Sanduleanu, José A. Tierno, Daniel J. Friedman:
Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(8): 2243-2252 (2014) - [c7]Shupeng Sun, Xin Li:
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space. ICCAD 2014: 324-331 - 2013
- [c6]Shupeng Sun, Xin Li, Chenjie Gu:
Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits. CICC 2013: 1-4 - [c5]Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileggi, Arun Natarajan, Mark A. Ferriss, Jean-Olivier Plouchart, Bodhisatwa Sadhu, Benjamin D. Parker, Alberto Valdes-Garcia, Mihai A. T. Sanduleanu, José A. Tierno, Daniel J. Friedman:
Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion. CICC 2013: 1-4 - [c4]Fa Wang, Wangyang Zhang, Shupeng Sun, Xin Li, Chenjie Gu:
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. DAC 2013: 64:1-64:6 - [c3]Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu:
Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space. ICCAD 2013: 478-485 - [c2]Xin Li, Fa Wang, Shupeng Sun, Chenjie Gu:
Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits. ICCAD 2013: 795-802 - 2012
- [j1]Shupeng Sun, Yamei Feng, Changdao Dong, Xin Li:
Efficient SRAM Failure Rate Prediction via Gibbs Sampling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(12): 1831-1844 (2012) - [c1]Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun, Chenjie Gu:
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion. ICCAD 2012: 627-634
Coauthor Index
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