"Bayesian model fusion: a statistical framework for efficient pre-silicon ..."

Xin Li et al. (2013)

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DOI: 10.1109/ICCAD.2013.6691204

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Xin Li, Fa Wang, Shupeng Sun, Chenjie Gu:
Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits. ICCAD 2013: 795-802

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