"Fast statistical analysis of rare circuit failure events via scaled-sigma ..."

Shupeng Sun et al. (2013)

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DOI: 10.1109/ICCAD.2013.6691160

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu:
Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space. ICCAD 2013: 478-485

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