"Fast statistical analysis of rare circuit failure events via Bayesian ..."

Shupeng Sun, Xin Li (2015)

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DOI: 10.1109/CICC.2015.7338409

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Shupeng Sun, Xin Li:
Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space. CICC 2015: 1-4

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