"Fast statistical analysis of rare circuit failure events via subset ..."

Shupeng Sun, Xin Li (2014)

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DOI: 10.1109/ICCAD.2014.7001370

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Shupeng Sun, Xin Li:
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space. ICCAD 2014: 324-331

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