"Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma ..."

Shupeng Sun et al. (2015)

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DOI: 10.1109/TCAD.2015.2404895

access: closed

type: Journal Article

metadata version: 2020-09-24

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Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu:
Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(7): 1096-1109 (2015)

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