- Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment. ATS 2021: 139-140 - Michihiro Shintani, Mamoru Ishizaka, Michiko Inoue:
Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for Memristor Neural Network. ATS 2021: 25-30 - Warin Sootkaneung, Sasithorn Chookaew, Suppachai Howimanporn:
Temperature-Aware Evaluation and Mitigation of Logic Soft Errors Under Circuit Variations. ATS 2021: 31-36 - Yu Tang, Le Zhao, Wei Yuan, Xu Wang:
CausalTester: Measuring the Consistency of Replicated Services via Causality Semantics. ATS 2021: 49-54 - Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux:
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions. ATS 2021: 97-102 - Zhendong Wang, Rujia Wang, Zihang Jiang, Xulong Tang, Shouyi Yin, Yang Hu:
Towards a Secure Integrated Heterogeneous Platform via Cooperative CPU/GPU Encryption. ATS 2021: 115-120 - Qizhen Xu, Liwei Chen, Gang Shi:
Twine Stack: A Hybrid Mechanism Achieving Less Cost for Return Address Protection. ATS 2021: 7-12 - Dun-An Yang, Jing-Jia Liou, Harry H. Chen:
Analyzing Transient Faults and Functional Error Rates of a RISC-V Core: A Case Study. ATS 2021: 133-138 - Yunying Ye, Shan Li, Haihua Shen, Huawei Li, Xiaowei Li:
SeGa: A Trojan Detection Method Combined With Gate Semantics. ATS 2021: 43-48 - 30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021. IEEE 2021, ISBN 978-1-6654-4051-6 [contents]
- 2020
- Arbab Alamgir, Abu Khari bin A'Ain, Norlina Paraman, Usman Ullah Sheikh, Ian Andrew Grout:
A comparative analysis of LFSR cascading for hardware efficiency and high fault coverage in BIST applications. ATS 2020: 1-5 - Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff:
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. ATS 2020: 1-6 - Zolboo Byambadorj, Koji Asami, Takahiro J. Yamaguchi, Akio Higo, Masahiro Fujita, Tetsuya Iizuka:
Theoretical Analysis on Noise Performance of Modulated Wideband Converters for Analog Testing. ATS 2020: 1-6 - Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
NodeRank: Observation-Point Insertion for Fault Localization in Monolithic 3D ICs∗. ATS 2020: 1-6 - Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty:
C-Testing of AI Accelerators *. ATS 2020: 1-6 - Shengyu Duan, Peng Wang, Gaole Sai:
BTI Aging Monitoring based on SRAM Start-up Behavior. ATS 2020: 1-6 - Masayuki Gondo, Yousuke Miyake, Takaaki Kato, Seiji Kajihara:
On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor. ATS 2020: 1-6 - Koutaro Hachiya:
A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids. ATS 2020: 1-6 - Jian Hu, Yongyang Hu, Long Yu, Haitao Yang, Yun Kang, Jie Cheng:
Validating GCSE in the scheduling of high-level synthesis. ATS 2020: 1-6 - Wei Hu, Lingjuan Wu, Yu Tai, Jing Tan, Jiliang Zhang:
A Unified Formal Model for Proving Security and Reliability Properties. ATS 2020: 1-6 - Shi-Yu Huang:
Overview of On-Chip Performance Monitors for Clock Signals. ATS 2020: 1-4 - Gary K.-C. Huang, Dave Y.-W. Lin, John Z.-L. Tang, Charles H.-P. Wen:
SDPTA: Soft-Delay-aware Pattern-based Timing Analysis and Its Path-Fixing Mechanism. ATS 2020: 1-6 - Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty:
Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *. ATS 2020: 1-6 - Takaaki Ibuchi, Tsuyoshi Funaki:
EMI characterization for power conversion circuit with SiC power devices. ATS 2020: 1-6 - Jakub Janicki, Grzegorz Mrugalski, Artur Stelmach, Szczepan Urban:
Scan Chain Diagnosis-Driven Test Response Compactor. ATS 2020: 1-6 - Tanusree Kaibartta, G. P. Biswas, Debesh K. Das:
Heuristic Approach for Identification of Random TSV Defects in 3D IC During Pre-bond Testing. ATS 2020: 1-6 - Chee Hoo Kok, Soon Ee Ong:
CPU Utilization Micro-Benchmarking for RealTime Workload Modeling. ATS 2020: 1-2 - Jin-Fu Li, Tsai-Ling Tsai, Chun-Lung Hsu, Chi-Tien Sun:
Testing of Configurable 8T SRAMs for In-Memory Computing. ATS 2020: 1-5 - Chih-Yan Liu, Mu-Ting Wu, James Chien-Mo Li, Gaurav Bhargava, Chris Nigh:
Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips. ATS 2020: 1-7 - Fukashi Morishita, Masanori Otsuka, Wataru Saito:
An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor. ATS 2020: 1-6