"Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay ..."

Shao-Chun Hung et al. (2020)

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DOI: 10.1109/ATS49688.2020.9301568

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty:
Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs ^*. ATS 2020: 1-6

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