"Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for ..."

Michihiro Shintani, Mamoru Ishizaka, Michiko Inoue (2021)

> Home

Details and statistics

DOI: 10.1109/ATS52891.2021.00017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ats/ShintaniII21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/ShintaniII21
Michihiro Shintani, Mamoru Ishizaka, Michiko Inoue:
Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for Memristor Neural Network. ATS 2021: 25-30

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.