"Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms ..."

Yen Tran et al. (2021)

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DOI: 10.1109/ATS52891.2021.00029

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-17

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Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux:
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions. ATS 2021: 97-102

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