- Woongrae Kim, Linda Milor
:
Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells. VTS 2014: 1-6 - John Kim, Wolfgang Meyer, T. M. Mak, Amitava Majumdar:
Innovative practices session 3C: Solving today's test challenges. VTS 2014: 1 - Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala:
Innovative practices session 2C: Advanced in yield learning. VTS 2014: 1 - Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu:
A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. VTS 2014: 1-6 - Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen:
Auto-identification of positive feedback loops in multi-state vulnerable circuits. VTS 2014: 1-5 - Amitava Majumdar, Suriya Natarajan, Stephen K. Sunter, Prashant Goteti, Ke Huang:
Innovative practices session 4C: Disruptive solutions in the non-digital world. VTS 2014: 1 - Mohamed Metwally, Nicholai L'Esperance, Tian Xia, Mustapha Slamani:
Continuous wave radar circuitry testing using OFDM technique. VTS 2014: 1-6 - Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel:
TSV aware timing analysis and diagnosis in paths with multiple TSVs. VTS 2014: 1-6 - Shahrzad Mirkhani, Jacob A. Abraham:
Fast evaluation of test vector sets using a simulation-based statistical metric. VTS 2014: 1-6 - Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. VTS 2014: 1-6 - Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Hakim Zimouche:
Built-in self-test for manufacturing TSV defects before bonding. VTS 2014: 1-6 - Suriya Natarajan, Amitava Majumdar, Jeyavijayan Rajendran:
Hot topic session 9C: Test and fault tolerance for emerging memory technologies. VTS 2014: 1 - Sule Ozev, Bertan Bakkaloglu:
Special session 4B: Panel: Testing and calibration for power management circuits. VTS 2014: 1 - Irith Pomeranz:
Fault simulation with test switching for static test compaction. VTS 2014: 1-6 - Irith Pomeranz:
On the use of multi-cycle tests for storage of two-cycle broadside tests. VTS 2014: 1-6 - Michele Portolan, Michail Maniatakos:
Special session 8A: E.J. McCluskey Doctoral Thesis Award semi-final. VTS 2014: 1 - Pasquale Ranone, Giovanna Turvani, Fabrizio Riente, Mariagrazia Graziano, Massimo Ruo Roch, Maurizio Zamboni:
Fault tolerant nanoarray circuits: Automatic design and verification. VTS 2014: 1-6 - Alodeep Sanyal, Yanjing Li:
Special session 11C: Young professionals in test - Elevator talks. VTS 2014: 1 - Alodeep Sanyal, Yanjing Li, Yervant Zorian:
Special session 12C: Young professionals in test - Town meeting. VTS 2014: 1 - Breeta SenGupta, Erik Larsson:
Test planning and test access mechanism design for stacked chips using ILP. VTS 2014: 1-6 - Eshan Singh:
Modeling location based wafer die yield variation in estimating 3D stacked IC yield from wafer to wafer stacking. VTS 2014: 1-6 - Franco Stellari, Peilin Song, Herschel A. Ainspan:
Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements. VTS 2014: 1-6 - Haralampos-G. D. Stratigopoulos, Stephen Sunter:
Efficient Monte Carlo-based analog parametric fault modelling. VTS 2014: 1-6 - Stephen K. Sunter, Steve Comen, Paul Berndt, Ram Rajamani:
Innovative practices session 7C: Reduced pin-count testing - How low can we go? VTS 2014: 1 - Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
Quality versus cost analysis for 3D Stacked ICs. VTS 2014: 1-6 - Andres Viveros-Wacher, Ricardo Alejos, Liliana Alvarez, Israel Diaz-Castro, Brenda Marcial, Gaston Motola-Acuna, Edgar-Andrei Vega-Ochoa:
SMV methodology enhancements for high speed I/O links of SoCs. VTS 2014: 1-5 - Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik:
At-speed interconnect testing and test-path optimization for 2.5D ICs. VTS 2014: 1-6 - Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee:
Alternative "safe" test of hysteretic power converters. VTS 2014: 1-6 - Lu Wang, Xutao Wang, Milad Maleki, Bao Liu:
Power/ground supply voltage variation-aware delay test pattern generation. VTS 2014: 1-6 - Ya-Ru Wu, Yi-Keng Hsieh, Po-Chih Ku, Liang-Hung Lu:
A built-in gain calibration technique for RF low-noise amplifiers. VTS 2014: 1-6
