"Built-in self test methodology for diagnosis of backend wearout mechanisms ..."

Woongrae Kim, Linda Milor (2014)

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DOI: 10.1109/VTS.2014.6818746

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Woongrae Kim, Linda Milor:
Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells. VTS 2014: 1-6

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