- S. Bahrebar
, Dao Zhou, Sima Rastayesh, Huai Wang, Frede Blaabjerg:
Reliability assessment of power conditioner considering maintenance in a PEM fuel cell system. Microelectron. Reliab. 88-90: 1177-1182 (2018) - Nick Baker, Francesco Iannuzzo:
Smart SiC MOSFET accelerated lifetime testing. Microelectron. Reliab. 88-90: 43-47 (2018) - M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten:
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Microelectron. Reliab. 88-90: 1108-1112 (2018) - Mengtian Bao, Ying Wang, Xingji Li, Chaoming Liu, Cheng-Hao Yu, Fei Cao:
Simulation study of single event effects in the SiC LDMOS with a step compound drift region. Microelectron. Reliab. 91: 170-178 (2018) - Eivind Bardalen, Bjørnar Karlsen, Helge Malmbekk, Muhammad Nadeem Akram, Per Alfred Ohlckers:
Reliability study of fiber-coupled photodiode module for operation at 4 K. Microelectron. Reliab. 81: 362-367 (2018) - Andrew Barnes, Florence Hélière, P. Villar, Hannes Stuhldreier, C. Beaurain, D. Bouw, M. Grunwald, E. Moess, Tobias Muck, C. Schildbach, T. Ayles, A. Kramer, B. Bildner:
Qualification of GaN microwave transistors for the European Space Agency Biomass mission. Microelectron. Reliab. 88-90: 378-384 (2018) - R. C. de Barros, E. M. S. Brito, Giovani G. Rodrigues, Victor Flores Mendes, Allan Fagner Cupertino, Heverton Augusto Pereira:
Lifetime evaluation of a multifunctional PV single-phase inverter during harmonic current compensation. Microelectron. Reliab. 88-90: 1071-1076 (2018) - Joyeeta Basu, Nirmalya Samanta, Sukhendu Jana, Chirasree RoyChaudhuri:
Towards reliability enhancement of graphene FET biosensor in complex analyte: Artificial neural network approach. Microelectron. Reliab. 91: 154-159 (2018) - Michal Baszynski, P. Rydygier, Mariusz Wojcik:
Experimental studies of: Laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate. Microelectron. Reliab. 88-90: 31-37 (2018) - Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura:
Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system. Microelectron. Reliab. 88-90: 500-504 (2018) - Canras Batunlu, Al-Hussein Albarbar:
Strategy for enhancing reliability and lifetime of DC-AC inverters used for wind turbines. Microelectron. Reliab. 85: 25-37 (2018) - D. Beckmeier, Andreas Martin:
Variation-resilient quantifiable plasma process induced damage monitoring. Microelectron. Reliab. 88-90: 152-158 (2018) - Mohamed Ali Belaïd:
Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests. Microelectron. Reliab. 91: 8-14 (2018) - Mirko Bernardoni, Nicola Delmonte, Diego Chiozzi, Paolo Cova:
Non-linear thermal simulation at system level: Compact modelling and experimental validation. Microelectron. Reliab. 80: 223-229 (2018) - Abdellatif Bey-Temsamani, S. Kauffmann, Stijn Helsen, T. Gaens, V. Driesen:
Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications. Microelectron. Reliab. 88-90: 54-60 (2018) - Anne Beyreuther, Norbert Herfurth, Elham Amini, Tomonori Nakamura, Ingrid De Wolf, Christian Boit:
Photon emission as a characterization tool for bipolar parasitics in FinFET technology. Microelectron. Reliab. 88-90: 273-276 (2018) - Jinshun Bi, Yuan Duan, Kai Xi, Bo Li:
Total ionizing dose and single event effects of 1 Mb HfO2-based resistive-random-access memory. Microelectron. Reliab. 88-90: 891-897 (2018) - Dimitrios Birmpiliotis, Matroni Koutsoureli, J. Kohylas, George J. Papaioannou, A. Ziaei:
Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches. Microelectron. Reliab. 88-90: 840-845 (2018) - F. Boige, Frédéric Richardeau, Stéphane Lefebvre, Jean-Marc Blaquière, G. Guibaud, A. Bourennane:
Ensure an original and safe "fail-to-open" mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation. Microelectron. Reliab. 88-90: 598-603 (2018) - Adrian Bojita, Cristian Boianceanu, Marius Purcar, Ciprian Florea, Dan Simon, Cosmin-Sorin Plesa:
A simple metal-semiconductor substructure for the advanced thermo-mechanical numerical modeling of the power integrated circuits. Microelectron. Reliab. 87: 142-150 (2018) - Matteo Borga, Matteo Meneghini, Steve Stoffels, Marleen Van Hove, M. Zhao, X. Li, Stefaan Decoutere, Enrico Zanoni, Gaudenzio Meneghesso:
Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs. Microelectron. Reliab. 88-90: 584-588 (2018) - Thiago Hanna Both, Gabriela Firpo Furtado, Gilson Inácio Wirth:
Modeling and simulation of the charge trapping component of BTI and RTS. Microelectron. Reliab. 80: 278-283 (2018) - Julio Brandelero, Jeffrey Ewanchuk, Nicolas Degrenne, Stefan Mollov:
Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module. Microelectron. Reliab. 88-90: 428-432 (2018) - Mads Brincker, Peter Kjær Kristensen, S. Söhl, R. Eisele, Vladimir N. Popok:
Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects - A novel approach for hybrid metal baseplates. Microelectron. Reliab. 88-90: 774-778 (2018) - E. M. S. Brito, Allan Fagner Cupertino, Paula Diaz Reigosa, Yongheng Yang, Victor Flores Mendes, Heverton Augusto Pereira:
Impact of meteorological variations on the lifetime of grid-connected PV inverters. Microelectron. Reliab. 88-90: 1019-1024 (2018) - Matteo Buffolo, M. Pietrobon, Carlo De Santi, F. Samparisi, Michael L. Davenport, John E. Bowers, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. Microelectron. Reliab. 88-90: 855-858 (2018) - Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester:
Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. Microelectron. Reliab. 88-90: 878-881 (2018) - Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester:
Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs. Microelectron. Reliab. 88-90: 882-886 (2018) - Daniela Cavallaro, Rosario Greco, Gaetano Bazzano:
Effect of solder material thickness on Power MOSFET reliability by Electro-thermo-Mechanical Simulations. Microelectron. Reliab. 88-90: 1168-1171 (2018) - Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo:
Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. Microelectron. Reliab. 88-90: 627-630 (2018)
