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ORCIDNicola Wrachien
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2010 – 2019
- 2018
[j12]Marco Buonomo
, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester:
Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. Microelectron. Reliab. 88-90: 878-881 (2018)- [j11]Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester:
Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs. Microelectron. Reliab. 88-90: 882-886 (2018) - 2015
- [j10]Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester:
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectron. Reliab. 55(9-10): 1790-1794 (2015) - [j9]Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs:
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells. Microelectron. Reliab. 55(9-10): 1795-1799 (2015) - [c2]Andrea Cester, Nicola Wrachien, Massimiliano Bon, Gaudenzio Meneghesso, Roberta Bertani, Roberto Tagliaferro, Simone Casolucci, Thomas M. Brown, Andrea Reale, Aldo Di Carlo:
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects. IRPS 2015: 3 - 2014
- [j8]Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini:
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. Microelectron. Reliab. 54(9-10): 1638-1642 (2014) - [c1]Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini:
Effects of constant voltage stress on organic complementary logic inverters. ESSDERC 2014: 298-301 - 2013
- [j7]Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso:
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric. Microelectron. Reliab. 53(9-11): 1798-1803 (2013) - [j6]Daniele Bari, Nicola Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester:
Comparison between positive and negative constant current stress on dye-sensitized solar cells. Microelectron. Reliab. 53(9-11): 1804-1808 (2013) - 2012
- [j5]Nicola Wrachien, Daniel Bari, Jaroslav Kovác, Jan Jakabovic, Daniel Donoval, Gaudenzio Meneghesso, Andrea Cester:
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure. Microelectron. Reliab. 52(9-10): 2490-2494 (2012) - [j4]Daniele Bari, Nicola Wrachien, Roberto Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester:
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED. Microelectron. Reliab. 52(9-10): 2495-2499 (2012) - 2011
- [j3]Daniele Bari, Nicola Wrachien, R. Tagliaferro, Stefano Penna, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester:
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs). Microelectron. Reliab. 51(9-11): 1762-1766 (2011) - 2010
- [b1]Nicola Wrachien:
Advanced memories to overcome the flash memory weaknesses. University of Padua, Italy, 2010 - [j2]Andrea Cester, Daniele Bari, J. Framarin, Nicola Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown:
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED. Microelectron. Reliab. 50(9-11): 1866-1870 (2010)
2000 – 2009
- 2007
- [j1]Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi:
Ionising radiation and electrical stress on nanocrystal memory cell array. Microelectron. Reliab. 47(4-5): 602-605 (2007)
Coauthor Index
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