"Physics-of-Failure (PoF) methodology for qualification and lifetime ..."

Abdellatif Bey-Temsamani et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.084

access: closed

type: Journal Article

metadata version: 2020-02-22

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Abdellatif Bey-Temsamani, S. Kauffmann, Stijn Helsen, T. Gaens, V. Driesen:
Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications. Microelectron. Reliab. 88-90: 54-60 (2018)

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