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Conference and Workshop Papers
- 2019
[c14]Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn
:
An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test. ITC 2019: 1-10- 2018
- [c13]Peter Wohl, John A. Waicukauski, Gregory A. Maston, Jonathon E. Colburn:
XLBIST: X-Tolerant Logic BIST. ITC 2018: 1-9 - 2017
- [c12]Zipeng Li, Jonathon E. Colburn, Vinod Pagalone, Kaushik Narayanun, Krishnendu Chakrabarty:
Test-cost optimization in a scan-compression architecture using support-vector regression. VTS 2017: 1-6 - 2016
- [c11]Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Amit Sanghani, Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Jonathon E. Colburn:
Flexible scan interface architecture for complex SoCs. VTS 2016: 1-6 - [c10]Milind Sonawane, Pavan Kumar Datla Jagannadha, Sailendra Chadalavada, Shantanu Sarangi, Mahmut Yilmaz, Amit Sanghani, Karthikeyan Natarajan, Jonathon E. Colburn, Anubhav Sinha:
Dynamic docking architecture for concurrent testing and peak power reduction. VTS 2016: 1-6 - 2014
- [c9]Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane:
Achieving extreme scan compression for SoC Designs. ITC 2014: 1-8 - 2013
- [c8]Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn:
Two-level compression through selective reseeding. ITC 2013: 1-10 - [c7]Jonathon E. Colburn, Kun Young Chung, Haluk Konuk, Y. Dong:
Innovative practices session 6C: Latest practices in test compression. VTS 2013: 1 - [c6]P. Pant, M. Amodeo, Sujal Vora, Jonathon E. Colburn:
Innovative practices session 10C: Delay test. VTS 2013: 1 - 2012
- [c5]Peter Wohl, John A. Waicukauski, Frederic Neuveux, Jonathon E. Colburn:
Hybrid selector for high-X scan compression. ITC 2012: 1-10 - [c4]Peter Wohl, John A. Waicukauski, Jonathon E. Colburn:
Enhancing testability by structured partial scan. VTS 2012: 152-157 - 2000
- [c3]Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri:
Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28 - 1999
- [c2]David B. Lavo, Tracy Larrabee, Jonathon E. Colburn:
Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis. ITC 1999: 1065-1072 - [c1]Julie D. Segal, Sergei Bakarian, Jonathon E. Colburn, Madan Kumar, Chang Hong, Alex Shubat:
Determining Redundancy Requirements for Memory Arrays with Critical Area Analysis. MTDT 1999: 48-53
Coauthor Index
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