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Haluk Konuk
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2010 – 2019
- 2015
- [c14]Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada:
Design for low test pattern counts. DAC 2015: 136:1-136:6 - 2013
- [c13]Jonathon E. Colburn, Kun Young Chung, Haluk Konuk, Y. Dong:
Innovative practices session 6C: Latest practices in test compression. VTS 2013: 1
2000 – 2009
- 2009
- [c12]Haluk Konuk:
Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing. VTS 2009: 33-38 - [c11]Haluk Konuk:
DFT and Test Problems from the Trenches. VTS 2009: 120 - 2003
- [c10]Haluk Konuk, Leon Xiao:
DFFT : Design For Functional Testability. ITC 2003: 1105-1114 - 2002
- [c9]C.-H. Chia, Sujit Dey, Faraydon Karim, Haluk Konuk, Keesup Kim:
Validation and Test of Network Processors and ASICs. VTS 2002: 407-410 - 2000
- [c8]Haluk Konuk:
On invalidation mechanisms for non-robust delay tests. ITC 2000: 393-399
1990 – 1999
- 1999
- [j3]Haluk Konuk:
Voltage- and current-based fault simulation for interconnect open defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(12): 1768-1779 (1999) - 1998
- [j2]Haluk Konuk, F. Joel Ferguson:
Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(11): 1200-1210 (1998) - 1997
- [c7]Haluk Konuk:
Fault simulation of interconnect opens in digital CMOS circuits. ICCAD 1997: 548-554 - [c6]Haluk Konuk, F. Joel Ferguson:
Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits. ITC 1997: 597-606 - 1996
- [j1]Haluk Konuk, F. Joel Ferguson, Tracy Larrabee:
Charge-based fault simulation for CMOS network breaks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(12): 1555-1567 (1996) - [c5]Haluk Konuk, F. Joel Ferguson:
An unexpected factor in testing for CMOS opens: the die surface. VTS 1996: 422-429 - 1995
- [c4]Haluk Konuk, F. Joel Ferguson, Tracy Larrabee:
Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks. DAC 1995: 345-351 - 1994
- [c3]Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk:
Fastpath: A Path-Delay Test Generator for Standard Scan Designs. ITC 1994: 154-163 - 1993
- [c2]Haluk Konuk, Tracy Larrabee:
Explorations of sequential ATPG using Boolean satisfiability. VTS 1993: 85-90 - 1990
- [c1]Christos A. Papachristou, Haluk Konuk:
A Linear Program Driven Scheduling and Allocation Method Followed by an Interconnect Optimization Algorithm. DAC 1990: 77-83
Coauthor Index
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