"An unexpected factor in testing for CMOS opens: the die surface."

Haluk Konuk, F. Joel Ferguson (1996)

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DOI: 10.1109/VTEST.1996.510888

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Haluk Konuk, F. Joel Ferguson:
An unexpected factor in testing for CMOS opens: the die surface. VTS 1996: 422-429

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