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"Test-cost optimization in a scan-compression architecture using ..."

Zipeng Li et al. (2017)

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DOI: 10.1109/VTS.2017.7928956

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vts/LiCPNC17
Zipeng Li, Jonathon E. Colburn, Vinod Pagalone, Kaushik Narayanun, Krishnendu Chakrabarty:
Test-cost optimization in a scan-compression architecture using support-vector regression. VTS 2017: 1-6

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