"Achieving extreme scan compression for SoC Designs."

Peter Wohl et al. (2014)

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DOI: 10.1109/TEST.2014.7035294

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane:
Achieving extreme scan compression for SoC Designs. ITC 2014: 1-8

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