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Journal Articles
- 2013
[j3]Michele Portolan
, Bradford G. Van Treuren, Suresh Goyal:
Executing IJTAG: Are Vectors Enough? IEEE Des. Test 30(5): 15-25 (2013)- 2010
- [j2]Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook:
A Common Language Framework for Next-Generation Embedded Testing. IEEE Des. Test Comput. 27(5): 36-49 (2010) - 2003
- [j1]Bradford G. Van Treuren, José M. Miranda:
Embedded Boundary Scan. IEEE Des. Test Comput. 20(2): 20-25 (2003)
Conference and Workshop Papers
- 2022
- [c11]Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo:
IEEE P1687.1: Extending the Network Boundaries for Test. ITC 2022: 382-390 - 2021
- [c10]Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim:
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. ETS 2021: 1-10 - 2020
- [c9]Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick:
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC 2020: 1-10 - 2010
- [c8]Michele Portolan, Bradford G. Van Treuren, Suresh Goyal:
Scan chain securization though Open-Circuit Deadlocks. ITC 2010: 808 - 2009
- [c7]Michele Portolan, Suresh Goyal, Bradford G. Van Treuren:
Scalable and efficient integrated test architecture. ITC 2009: 1 - 2008
- [c6]Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook:
A New Language Approach for IJTAG. ITC 2008: 1-10 - [c5]Bradford G. Van Treuren:
System JTAG Initiative Group Advancements. ITC 2008: 1 - [c4]Bradford G. Van Treuren, Chen-Huan Chiang, Kenneth Honaker:
Problems Using Boundary-Scan for Memory Cluster Tests. ITC 2008: 1-10 - 2007
- [c3]Tapan J. Chakraborty, Chen-Huan Chiang, Bradford G. Van Treuren:
A practical approach to comprehensive system test & debug using boundary scan based test architecture. ITC 2007: 1-10 - [c2]Bradford G. Van Treuren, Adam W. Ley:
JTAG system test in a MicroTCA world. ITC 2007: 1-10 - 2005
- [c1]Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda:
JTAG-based vector and chain management for system test. ITC 2005: 10
Coauthor Index
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