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Michael Laisne
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- affiliation: Qualcomm, USA
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2020 – today
- 2022
- [c10]Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo:
IEEE P1687.1: Extending the Network Boundaries for Test. ITC 2022: 382-390 - 2020
- [c9]Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick:
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC 2020: 1-10 - [c8]Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne:
Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. ITC 2020: 1-10
2010 – 2019
- 2017
- [j1]Al Crouch, Michael Laisne, Martin Keim:
Generalizing Access to Instrumentation Embedded in a Semiconductor Device. Computer 50(7): 92-95 (2017) - [c7]Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason:
Single-pin test control for Big A, little D devices. ITC 2017: 1-10 - 2011
- [c6]Dragoljub Gagi Drmanac, Michael Laisne:
Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. ITC 2011: 1-10 - [c5]Mike Laisne:
Advanced methods for leveraging new test standards. VTS 2011: 97
2000 – 2009
- 2007
- [c4]Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas, Michael Laisne, Hailong Cui, Tsvetomir Petrov:
Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture. ISQED 2007: 717-722 - [c3]Michael Laisne, Triphuong Nguyen, Songlin Zuo, Xiangdong Pan, Hailong Cui, Cher Bai, A. Street, M. Parley, Neetu Agrawal, K. Sundararaman:
Verification and debugging of IDDQ test of low power chips. ITC 2007: 1-7 - [c2]Edward Flanigan, Rajsekhar Adapa, Hailong Cui, Michael Laisne, Spyros Tragoudas, Tsvetomir Petrov:
Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture. VLSI Design 2007: 805-812 - 2006
- [c1]Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote:
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8
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