"Single-pin test control for Big A, little D devices."

Michael Laisne et al. (2017)

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DOI: 10.1109/TEST.2017.8242069

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason:
Single-pin test control for Big A, little D devices. ITC 2017: 1-10

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