"Industrial Application of IJTAG Standards to the Test of Big-A/little-d ..."

Hans Martin von Staudt et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325267

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

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Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne:
Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. ITC 2020: 1-10

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