"A Common Language Framework for Next-Generation Embedded Testing."

Michele Portolan et al. (2010)

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DOI: 10.1109/MDT.2010.1

access: closed

type: Journal Article

metadata version: 2020-05-17

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Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook:
A Common Language Framework for Next-Generation Embedded Testing. IEEE Des. Test Comput. 27(5): 36-49 (2010)

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