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Journal Articles
- 2021
[j2]Gaurav Rajavendra Reddy
, Constantinos Xanthopoulos, Yiorgos Makris:
On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(12): 2522-2527 (2021)- 2015
- [j1]Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris:
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32(1): 53-60 (2015)
Conference and Workshop Papers
- 2023
- [c14]V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris:
Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. VTS 2023: 1-7 - 2022
- [c13]Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao:
Improvements in Automated IC Socket Pin Defect Detection. ITC 2022: 568-572 - [c12]Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim:
Zero Trust Approach to IC Manufacturing and Testing. ITC 2022: 583-586 - 2021
- [c11]V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, E. De La Rosa, C. Alleyne, S. Mier, Yiorgos Makris:
Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation. VTS 2021: 1-7 - 2020
- [c10]Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal:
Automated Socket Anomaly Detection through Deep Learning. ITC 2020: 1-5 - 2019
- [c9]Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris:
Wafer-Level Adaptive Vmin Calibration Seed Forecasting. DATE 2019: 1673-1678 - [c8]Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris:
Automated Die Inking through On-line Machine Learning. IOLTS 2019: 27-32 - [c7]Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan:
Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion. ITC 2019: 1-3 - [c6]Deepika Neethirajan, Constantinos Xanthopoulos, Kiruba S. Subramani, Keith Schaub, Ira Leventhal, Yiorgos Makris:
Machine Learning-based Noise Classification and Decomposition in RF Transceivers. VTS 2019: 1-6 - 2018
- [c5]Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris:
Enhanced hotspot detection through synthetic pattern generation and design of experiments. VTS 2018: 1-6 - 2017
- [c4]Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris:
Wafer-level adaptive trim seed forecasting based on E-tests. ISCAS 2017: 1-4 - [c3]Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris:
Automated die inking: A pattern recognition-based approach. ITC 2017: 1-6 - 2016
- [c2]Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8 - 2014
- [c1]Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris:
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC 2014: 1-7
Informal and Other Publications
- 2020
- [i1]Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris:
On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement. CoRR abs/2007.05879 (2020)
Coauthor Index
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